VTT Technical Research Centre of Finland is the first in the country to put into service a plasma-FIB scanning electron microscope.
The TESCAN AMBER X system, a multi-million dollar investment, is expected to significantly enhance the scope of materials research in multiple sectors including the hydrogen economy, microelectronics, and maritime industry.
The TESCAN AMBER X is Finland’s first Focused Ion Beam (FIB) Scanning Electron Microscope (SEM) using Xenon plasma. This innovative equipment, which is limited globally and in the Nordic region, offers a significant potential for advancing materials research and expediting materials development.
As described by VTT’s Senior Scientist, Supriya Nandy, the AMBER X system offers rapid materials characterization in 3D. This new capability is particularly beneficial in speeding up the materials engineering and acceleration platforms, potentially reducing the time to market from design to just about a tenth.
The TESCAN AMBER X is designed to conduct site-specific investigations on various materials, from ceramics and metals to soft materials like wood and paper, with nanometer accuracy. The system allows for the simultaneous imaging and testing of a sample, a feature useful in gauging material reactions to different loads.
In addition to facilitating materials development, the new system is expected to underpin material damage investigation across diverse industries, from chemical and paper to maritime sectors. The system’s accuracy in scanning sample material can support efforts to identify and prevent structural damages.
Research Team Leader at VTT, Janne Pakarinen, outlined several industries that could benefit from the new FIB-SEM tool. From marine and aviation to emerging industries like hydrogen economy, this technology can help ascertain the durability of materials under various conditions. The semiconductor and battery sectors might also find it valuable.
